Defense Microelectronic Activity

Radiation Testing

The Science and Engineering Gamma Irradiation Test (SEGIT) facility was established in 1997 as a business unit of the Defense Microelectronics Activity (DMEA), which reports to the Assistant Secretary of Defense for Sustainment (ASD(S)). The mission of the SEGIT Facility is to deliver radiation-testing solutions to meet the needs of the Department of Defense (DoD). Equipment and their components employed by the Warfighter are exposed to numerous manufactured (e.g., nuclear power plants on naval vessels) and natural (e.g., satellites in orbit around the earth) radiation environments. Radiation testing is required to determine suitability of components in harsh radiation environments. The SEGIT Facility has performed testing on various types of test articles from pressure transducers used in nuclear power plants, microelectronics such as Field Programmable Gate Arrays (FPGAs) used in space applications, cables qualified for use on the Parker Solar Probe, and coupons of various exotic materials and coatings to evaluate a material’s radiation hardness. Since the irradiator installation, the SEGIT Facility has provided testing to over a hundred different customers. Compliant to MIL-STD-750 and MIL-STD-883, the SEGIT Facility can perform all test methods covered under Test Method 1019 including High Dose Rate, Enhanced Low Dose Rate Sensitivity (ELDRS) testing, and Metal Oxide Semiconductor (MOS) Accelerated Anneal Test (MAAT) utilizing their Anneal ovens. Testing is facilitated by certified engineers and supported by DMEA’s other services providing test planning, test board design, electrical measurement and characterization, and custom benchtop testing. With the use of a Dewar Temperature System, High Dose Rate testing can be performed in a temperature (-150 to +150°C), pressure (down to 10^-6 torr), and humidity controlled environment. The SEGIT Facility is the only DoD TID laboratory that has ISO/IEC 17025:2017 accreditation. Accreditation of the SEGIT has been continuous since 2001. ISO/IEC 17025:2017 is the primary international standard for general requirements for testing and calibration laboratories’ competence.